In recent years, researchers  from different fields have been studying the phenomenon of  electrowetting for fluid control at the microscale. Applications include optical displays, localized cooing, and digital microfluidics.  However, electrowetting devices are susceptible to rapid degradation.  The large electrical fields and frequently corrosive environments are made more challenging by the drive to reduce dielectric thickness for lower operating voltages.

We are using a novel electrowetting measurement method to study the degradation mechanisms of common dielectric materials under electrowetting conditions.

Laboratory for Micro/Nano Integration

Department of Mechanical Engineering