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Professor Alex A. Volinsky, Ph.D.
Associate
Professor
Department
of Mechanical Engineering
4202 E
Fowler Ave. ENB 118
Tampa, FL
33620
Phone: (813)
974-5658
Fax: (813)
974-3539
Office
location: ENC 2214
Email:
volinsky at eng.usf.edu
Research interests: Thin films
processing, mechanical properties and characterization. Adhesion and
fracture of thin films. Nanoindentation. Pattern formation. Irradiated materials properties
and X-Ray diffraction. |
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Research highlights:
KBr single crystal surface rippling due to wear. Image size is 4x4
microns. Click on the image to see the movie (3 Mb).
Telephone cord delamination caused by a thin film compressive
residual stress relief. Click on the left image to view a real
time delamination process
(4.3 MB). For a detailed explanation please see
this MRS paper.
International Collaborations:
Professor
Marek Szymonski, Jagiellonian University, Krakow Poland
Professor Dirk Meyer, Technical University Dresden, Germany
Professor Kewei Gao,
University of Science and Technology Beijing
News:
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2008 NACE Symposium on Environmentally Assisted Cracking TEG
186X
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2006 US-Japan NSF-MEXT Young Investigator Exchange
Program
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Deformation and Fracture From Nano to Macro: A Symposium
Honoring W.W. Gerberich’s 70th Birthday at 2006 TMS meeting
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Corrosion 2006: NACE 61st Annual Conference and Exposition,
March 12-16, San Diego, CA
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2005 Triservice Corrosion Conference, November 14-18,
Orlando, FL
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2005
ASME International Mechanical Engineering Congress and
Exposition, November 5-11, Orlando, FL
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NanoPol 2005
“Frontiers of Nanomechanical Testing” Workshop, June
16-17, Krakow Poland
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Marie Curie Host Fellowship for the 2005 Summer Visiting
Professor position at
Jagiellonian
University,
Faculty of Physics, Astronomy and Computer Science
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NACE International, The Corrosion Society awards a grant
"Adhesion Measurements of Thin Films in Corrosive
Environments".
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"
Nanoindentation for advanced microelectronic interconnects
mechanical characterization" paper received the Best
Presentation Award at the Nano and Giga Challenges in
Microelectronics 2004 conference in Krakow, Poland.
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ISI®
Essential Science Indicators
determined
Interfacial Toughness Measurements for Thin Films on Substrates,
A.A. Volinsky, N.R. Moody, W.W. Gerberich, Acta Mater. Vol.
50/3, pp. 441-466, 2002
paper to be one of the most cited recent papers in the field of
Materials Science.
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Nano and Giga
Challanges in Microelectronics Conference, Cracow Poland,
September 13-17, 2004
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2004 ASME
International Mechanical Engineering Congress, Mechanical
Integrity and Reliability of Electronic Materials Session, Anaheim CA,
November 13-19, 2004
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2002 Nano and
Giga Challenges in Microelectronics Photos, Moscow Russia
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